Sahin, D. Et Al. 2010. Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing. THIN SOLID FILMS , vol.518, no.9 , 2365-2369.

Sahin, D., YILDIZ, İ., Gencer, A. G., Aygun, G., Slaoui, A., & TURAN, R., (2010). Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing. THIN SOLID FILMS , vol.518, no.9, 2365-2369.

Sahin, D. Et Al. "Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing," THIN SOLID FILMS , vol.518, no.9, 2365-2369, 2010

Sahin, D. Et Al. "Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing." THIN SOLID FILMS , vol.518, no.9, pp.2365-2369, 2010

Sahin, D. Et Al. (2010) . "Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing." THIN SOLID FILMS , vol.518, no.9, pp.2365-2369.

@article{article, author={D. Sahin Et Al. }, title={Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing}, journal={THIN SOLID FILMS}, year=2010, pages={2365-2369} }