GÜRBULAK, B. Et Al. 2016. Structural Characterization of InSe:Zn Binary Semiconductor Grown by Bridgman Stockbarger Technique. International Journal of Thales Natural Sciences , vol.1, no.1 , 18-28.

GÜRBULAK, B., ASHKHASI, A., ŞATA, M., ÖZÇELİK, F. Ş., & DUMAN, S., (2016). Structural Characterization of InSe:Zn Binary Semiconductor Grown by Bridgman Stockbarger Technique. International Journal of Thales Natural Sciences , vol.1, no.1, 18-28.

GÜRBULAK, BEKİR Et Al. "Structural Characterization of InSe:Zn Binary Semiconductor Grown by Bridgman Stockbarger Technique," International Journal of Thales Natural Sciences , vol.1, no.1, 18-28, 2016

GÜRBULAK, BEKİR Et Al. "Structural Characterization of InSe:Zn Binary Semiconductor Grown by Bridgman Stockbarger Technique." International Journal of Thales Natural Sciences , vol.1, no.1, pp.18-28, 2016

GÜRBULAK, B. Et Al. (2016) . "Structural Characterization of InSe:Zn Binary Semiconductor Grown by Bridgman Stockbarger Technique." International Journal of Thales Natural Sciences , vol.1, no.1, pp.18-28.

@article{article, author={BEKİR GÜRBULAK Et Al. }, title={Structural Characterization of InSe:Zn Binary Semiconductor Grown by Bridgman Stockbarger Technique}, journal={International Journal of Thales Natural Sciences}, year=2016, pages={18-28} }