Isik, M. Et Al. 2008. Trap distribution in TlInS2 layered crystals from thermally stimulated current measurements. JOURNAL OF THE KOREAN PHYSICAL SOCIETY , vol.52, no.2 , 367-373.

Isik, M., Goksen, K., Gasanly, N. M., & Ozkan, H., (2008). Trap distribution in TlInS2 layered crystals from thermally stimulated current measurements. JOURNAL OF THE KOREAN PHYSICAL SOCIETY , vol.52, no.2, 367-373.

Isik, M. Et Al. "Trap distribution in TlInS2 layered crystals from thermally stimulated current measurements," JOURNAL OF THE KOREAN PHYSICAL SOCIETY , vol.52, no.2, 367-373, 2008

Isik, M. Et Al. "Trap distribution in TlInS2 layered crystals from thermally stimulated current measurements." JOURNAL OF THE KOREAN PHYSICAL SOCIETY , vol.52, no.2, pp.367-373, 2008

Isik, M. Et Al. (2008) . "Trap distribution in TlInS2 layered crystals from thermally stimulated current measurements." JOURNAL OF THE KOREAN PHYSICAL SOCIETY , vol.52, no.2, pp.367-373.

@article{article, author={M. Isik Et Al. }, title={Trap distribution in TlInS2 layered crystals from thermally stimulated current measurements}, journal={JOURNAL OF THE KOREAN PHYSICAL SOCIETY}, year=2008, pages={367-373} }