Gürbulak, B. Et Al. 2016. Structural Characterization of InSe:Zn Layer Semiconductor Grown by Bridgman/Stockbarger Technique. IPCAP , (Erzurum, Turkey), 60.

Gürbulak, B., Ashkhasi, A., Şata, M., Kaya, F. Ş., & Duman, S., (2016). Structural Characterization of InSe:Zn Layer Semiconductor Grown by Bridgman/Stockbarger Technique . IPCAP (pp.60). Erzurum, Turkey

Gürbulak, Bekir Et Al. "Structural Characterization of InSe:Zn Layer Semiconductor Grown by Bridgman/Stockbarger Technique," IPCAP, Erzurum, Turkey, 2016

Gürbulak, Bekir Et Al. "Structural Characterization of InSe:Zn Layer Semiconductor Grown by Bridgman/Stockbarger Technique." IPCAP , Erzurum, Turkey, pp.60, 2016

Gürbulak, B. Et Al. (2016) . "Structural Characterization of InSe:Zn Layer Semiconductor Grown by Bridgman/Stockbarger Technique." IPCAP , Erzurum, Turkey, p.60.

@conferencepaper{conferencepaper, author={Bekir Gürbulak Et Al. }, title={Structural Characterization of InSe:Zn Layer Semiconductor Grown by Bridgman/Stockbarger Technique}, congress name={IPCAP}, city={Erzurum}, country={Turkey}, year={2016}, pages={60} }