ÇİFTÇİ, İ. 2020. Topological Characterization of Silicon Carbide Structures. MATI , vol.2 , 12-23.

ÇİFTÇİ, İ., (2020). Topological Characterization of Silicon Carbide Structures. MATI , vol.2, 12-23.

ÇİFTÇİ, İdris. "Topological Characterization of Silicon Carbide Structures," MATI , vol.2, 12-23, 2020

ÇİFTÇİ, İdris. "Topological Characterization of Silicon Carbide Structures." MATI , vol.2, pp.12-23, 2020

ÇİFTÇİ, İ. (2020) . "Topological Characterization of Silicon Carbide Structures." MATI , vol.2, pp.12-23.

@article{article, author={İdris Çiftçi}, title={Topological Characterization of Silicon Carbide Structures}, journal={MATI}, year=2020, pages={12-23} }