M. ŞATA Et Al. , "Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy," International Conference onPhysical Chemistry and Functional Materials , Elazığ, Turkey, 2018
ŞATA, M. Et Al. 2018. Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy. International Conference onPhysical Chemistry and Functional Materials , (Elazığ, Turkey).
ŞATA, M., kARATAŞ, S., ERZENEOĞLU, S. Z., TURGUT, G., & GÜRBULAK, B., (2018). Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy . International Conference onPhysical Chemistry and Functional Materials, Elazığ, Turkey
ŞATA, Mehmet Et Al. "Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy," International Conference onPhysical Chemistry and Functional Materials, Elazığ, Turkey, 2018
ŞATA, Mehmet Et Al. "Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy." International Conference onPhysical Chemistry and Functional Materials , Elazığ, Turkey, 2018
ŞATA, M. Et Al. (2018) . "Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy." International Conference onPhysical Chemistry and Functional Materials , Elazığ, Turkey.
@conferencepaper{conferencepaper, author={Mehmet Şata Et Al. }, title={Investigation of Surface Topography of GaTe and GaTe:CdSemiconductors using Atomic Force Microscopy}, congress name={International Conference onPhysical Chemistry and Functional Materials}, city={Elazığ}, country={Turkey}, year={2018}}