YERCİ, S. Et Al. Characterization of Si nanocrystals. 2010. In Silicon Nanocrystals Fundamentals Synthesis and Applications , Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, 583-611.

YERCİ, S., DOGAN, I., SEYHAN, A., GENÇER İMER, A., & TURAN, R., (2010). Characterization of Si nanocrystals. Silicon Nanocrystals Fundamentals Synthesis and Applications (pp.583-611), Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

YERCİ, SELÇUK Et Al. "Characterization of Si nanocrystals." In Silicon Nanocrystals Fundamentals Synthesis and Applications , 583-611. Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, 2010

YERCİ, SELÇUK Et Al. "Characterization of Si nanocrystals." Silicon Nanocrystals Fundamentals Synthesis and Applications , Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, 2010, pp.583-611.

YERCİ, S. Et Al. (2010) "Characterization of Si nanocrystals", Silicon Nanocrystals Fundamentals Synthesis and Applications . Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

@bookchapter{bookchapter, author ={SELÇUK YERCİ Et Al. }, chaptertitle={Characterization of Si nanocrystals}, booktitle={ Silicon Nanocrystals Fundamentals Synthesis and Applications}, publisher={Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim}, city={},year={2010} }