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Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.
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M. CAKAR Et Al. , "Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.," Chemphyschem : a European journal of chemical physics and physical chemistry , vol.3, pp.701-4, 2002

CAKAR, M. Et Al. 2002. Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.. Chemphyschem : a European journal of chemical physics and physical chemistry , vol.3 , 701-4.

CAKAR, M., Temirci, C., & TURUT, A., (2002). Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.. Chemphyschem : a European journal of chemical physics and physical chemistry , vol.3, 701-4.

CAKAR, M, Cabir Temirci, And A TURUT. "Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.," Chemphyschem : a European journal of chemical physics and physical chemistry , vol.3, 701-4, 2002

CAKAR, M Et Al. "Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.." Chemphyschem : a European journal of chemical physics and physical chemistry , vol.3, pp.701-4, 2002

CAKAR, M. Temirci, C. And TURUT, A. (2002) . "Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.." Chemphyschem : a European journal of chemical physics and physical chemistry , vol.3, pp.701-4.

@article{article, author={M CAKAR Et Al. }, title={Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.}, journal={Chemphyschem : a European journal of chemical physics and physical chemistry}, year=2002, pages={701-4} }