İmer, A. G. Et Al. 2012. Structural characterization of Si1-xCx/SiC multilayer cosputtered films, evidence of the formation of Si nanocrytals in an amorphous matrix. Europian Material Research Society (EMRS) Spring Meeting , (Strazburg, France), 20.

İmer, A. G., yıldız, i., & Turan, R., (2012). Structural characterization of Si1-xCx/SiC multilayer cosputtered films, evidence of the formation of Si nanocrytals in an amorphous matrix . Europian Material Research Society (EMRS) Spring Meeting (pp.20). Strazburg, France

İmer, Arife, ilker yıldız, And Rasit Turan. "Structural characterization of Si1-xCx/SiC multilayer cosputtered films, evidence of the formation of Si nanocrytals in an amorphous matrix," Europian Material Research Society (EMRS) Spring Meeting, Strazburg, France, 2012

İmer, Arife G. Et Al. "Structural characterization of Si1-xCx/SiC multilayer cosputtered films, evidence of the formation of Si nanocrytals in an amorphous matrix." Europian Material Research Society (EMRS) Spring Meeting , Strazburg, France, pp.20, 2012

İmer, A. G. yıldız, i. And Turan, R. (2012) . "Structural characterization of Si1-xCx/SiC multilayer cosputtered films, evidence of the formation of Si nanocrytals in an amorphous matrix." Europian Material Research Society (EMRS) Spring Meeting , Strazburg, France, p.20.

@conferencepaper{conferencepaper, author={Arife Gençer İmer Et Al. }, title={Structural characterization of Si1-xCx/SiC multilayer cosputtered films, evidence of the formation of Si nanocrytals in an amorphous matrix}, congress name={Europian Material Research Society (EMRS) Spring Meeting}, city={Strazburg}, country={France}, year={2012}, pages={20} }