Modeling Relations of Attitudes towards Technology Use, Technology Competencies, Ownership, and Experiences to TPACK-Self Efficacy.
Copy For Citation
Yerdelen Damar S., Aydın S., BOZ Y.
88th NARST Annual International Conference,, Chicago, United States Of America, 11 - 14 April 2015, pp.2
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Publication Type:
Conference Paper / Summary Text
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City:
Chicago
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Country:
United States Of America
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Page Numbers:
pp.2
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Van Yüzüncü Yıl University Affiliated:
Yes