Modeling Relations of Attitudes towards Technology Use, Technology Competencies, Ownership, and Experiences to TPACK-Self Efficacy.

Yerdelen Damar S., Aydın S., BOZ Y.

88th NARST Annual International Conference,, Chicago, United States Of America, 11 - 14 April 2015, pp.2

  • Publication Type: Conference Paper / Summary Text
  • City: Chicago
  • Country: United States Of America
  • Page Numbers: pp.2
  • Van Yüzüncü Yıl University Affiliated: Yes