Behaviour of Electrical Capacitance and Depletion Layer of (Ag, Cu, Ni)/n-Si/Al Schottky Diodes by Ohmic Temperatures
Copy For Citation
Korkut A., İmer A. G.
2'nd International Congress on the World of Technology and Advanced Materials, Kırşehir, Turkey, 28 September - 02 October 2016, pp.57
-
Publication Type:
Conference Paper / Summary Text
-
City:
Kırşehir
-
Country:
Turkey
-
Page Numbers:
pp.57
-
Van Yüzüncü Yıl University Affiliated:
Yes