Structural Characterization of InSe:Zn Layer Semiconductor Grown by Bridgman/Stockbarger Technique

Gürbulak B., Ashkhasi A., Şata M., Kaya F. Ş., Duman S.

IPCAP, Erzurum, Turkey, 23 February 2016, pp.60

  • Publication Type: Conference Paper / Summary Text
  • City: Erzurum
  • Country: Turkey
  • Page Numbers: pp.60
  • Van Yüzüncü Yıl University Affiliated: Yes