Dependence of thermal annealing on the density distribution of interface states in Ti/n-GaAs(Te) Schottky diodes

Ayyildiz E., Bati B., Temirci C., Türüt A.

Applied Surface Science, vol.152, no.1, pp.57-62, 1999 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 152 Issue: 1
  • Publication Date: 1999
  • Doi Number: 10.1016/s0169-4332(99)00301-3
  • Journal Name: Applied Surface Science
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.57-62
  • Van Yüzüncü Yıl University Affiliated: No