Determination of the density distribution of interface states from high- and low-frequency capacitance characteristics of the tin/organic pyronine-B/p-type silicon structure.
Chemphyschem : a European journal of chemical physics and physical chemistry, cilt.3, ss.701-4, 2002 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 3
- Basım Tarihi: 2002
- Dergi Adı: Chemphyschem : a European journal of chemical physics and physical chemistry
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.701-4
- Van Yüzüncü Yıl Üniversitesi Adresli: Evet